Ключевые слова: HTS, GdBCO, coated conductors, tapes, circuit breaker, dc performance, fault currents, current limiting characteristics, modeling, experimental results
Tixador P., Gomory F., Bauer M., Noe M., Bocchi M., Calleja A., Deutscher G., Creusot C., Obradors X.*10, Pekarcikova M.*11, Sirois F.*12, Akbar A.
Ключевые слова: Europe, power equipment, FCL resistive, HTS, REBCO, tapes, coils pancake, fabrication, test results, current limiting characteristics, hot spots, economic analysis, status
Ключевые слова: power equipment, power supply, arc, HTS, wires, resistive transition, current limiting characteristics, modeling, numerical analysis
Ключевые слова: power equipment, HTS, REBCO, tapes, CroCo conductor, Roebel conductors, CORC cables, cables cold-dielectric, cables warm-dielectric, operational performance, short circuit test, fault currents, current limiting characteristics, recovery characteristics, cooling technology, dc performance, plans, review
Ключевые слова: power equipment, power electronics, grid operation, protective system, FCL resistive, design parameters, HTS, coated conductors, tapes, REBCO, substrate Hastelloy, coils pancake, overcurrent, current limiting characteristics, converters, current-voltage characteristics, measurement setup, fault currents, recovery characteristics, temperature distribution, test results
Ключевые слова: FCL inductive, FCL inductive, hybrid systems, current limiting characteristics, HTS, REBCO, tapes, coils pancake, design parameters, quench properties, critical current, magnetic field dependence, heat transfer, fault currents, transient performance, experimental results, overcurrent, voltage decay, time evolution, electric field distribution, numerical analysis, power equipment
Tixador P., Bauer M., Bruzek C., Sirois F., Grosse V., Lacroix C., Escamez G., Lavergne O., Leduc T., Dupuis-Desloges F., Moret L.
Ключевые слова: HTS, GdBCO, coated conductors, tapes, critical caracteristics, critical current density, dc performance, current limiting characteristics, high voltage process, resistance, temperature dependence, fault currents, quench properties, electric field, time evolution, n-value, test results
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